Impact of ESD on Reliability of CNTFET Devices

DUAN Saisai, YANG Jie, YUAN Qingyun, ZHANG Xijun

Journal of Army Engineering University of PLA ›› 2026, Vol. 5 ›› Issue (5) : 69-75.

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Journal of Army Engineering University of PLA ›› 2026, Vol. 5 ›› Issue (5) : 69-75. DOI: 10.12018/j .issn.2097-0730.20250821001

Impact of ESD on Reliability of CNTFET Devices

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2026, 5(5): 69-75 https://doi.org/10.12018/j .issn.2097-0730.20250821001

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